This is a sponsored post by STaR Technologies
The testing requirements for small pitch Mini- and Micro- LEDs are increasing in response to the growth of new LED displays. STAr Technologies’ Unicorn-LAIT series test systems, the advanced high throughput testers, integrate probe station, parallel test instruments, and probe card to meet the mass production needs for Micro-LED and Mini-LED testing.
STAr Unicorn-LAIT Mini- and Micro-LED Test System
STAr Unicorn-LAIT series is equipped with EMI shielded chamber for high-speed LED testing in an ultra-low noise environment. Magic-A200e probe station allows alignment of up to 6-inch wafers and automatic test probing with Multi-DUT LED probe cards. The closed-loop XYZ stages and coaxial microscopes provide the best accuracy in multi-LED stepping and high-resolution scanning and probing. In addition, the porous ceramic chuck (with auxiliary chucks) enables cleaning and contact-check to enhance LED test performance and dependable results.