US-based Teradyne, provider of automated test equipment and MicroLED Association member, today launched a new production-ready optical test platform for microLED devices, the Iris 100.
The company says that the new system brings semiconductor-grade optical test to microLED manufacturing, measuring every individual emitter in an array and integrating directly with the Teradyne UltraFLEXplus platform for combined optical and electrical test. The Iris 100 can be used for testing microLED microdisplays - and also microLED arrays used in optical interconnects.
The Teradyne Iris 100 was engineered for high-volume precision manufacturing with its spectrometer and high-resolution camera that measure the spectral response of the array, and per-pixel luminance and uniformity. Advanced test parallelization and image-processing algorithms enable characterization of a full array containing millions of microLEDs with high throughput. Leveraging Teradyne’s widely adopted IG-XL software, Iris 100 detects optical defects such as dead/stuck pixels and cluster defects early in the manufacturing process. Its NIST-traceable calibration workflow enables absolute measurements that correlate lots, wafers, and manufacturing sites.
