Semilab launched a new PL inspection system, the LumiPix-3000, with full wafer imaging capabilities designed for detecting intensity and wavelength defects in microLED devices.
Semilab says that its new system leverages advanced photoluminescence technology with multiple excitation options and high-resolution imaging to provide comprehensive defect analysis. It supports InGaN and AlInGaP materials on wafers up to 12 inches. Its non-destructive metrology approach enables the identification of various defects, including intensity variations, wavelength shifts, and morphological anomalies, based on the analysis of the captured PL images and other relevant data, while also fulfills industrial standards with its modern platform.
Posted: Dec 03,2025 by Ron Mertens
