This is a sponsored post by STAr Technologies
With Micro-LED moving from Engineering to Production, a near-zero tolerance for bad pixel, ultra-small pitch probing, automatic electrical and optical measurement systems need to step up. With STArâs enhanced Unicorn-LAIT II addresses these stricter testing requirements and with its unique parallel test architecture for electrical, driver functionality, RGB, optical testing capabilities.
STAr Unicorn-LAIT II Advanced Integrated Test System
Unicorn-LAIT II is an advanced high throughput LED test system, that caters for dies in hundreds of thousands to millions of LED per wafer. High Parallelization allows the customer to significantly reduce the Cost of Test and Test Time. The system provides critical measurements for Mini/Micro-LEDs and integrates parallel testing with the electrical, optical measurement with probe station and probe cards in one system, offering a comprehensive analysis result to industry users.